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チン シュンペイ
Chen Chunping 陳 春平 所属 神奈川大学 工学部 電気電子情報工学科 神奈川大学大学院 工学研究科 工学専攻(電気電子情報工学領域) 職種 准教授 |
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言語種別 | 英語 |
発行・発表の年月 | 2017/11 |
形態種別 | 学術雑誌 |
査読 | 査読あり |
標題 | Nondestructive Measurement of EM-parameters of High-loss Materials by Two-Probes-Method |
執筆形態 | 共著 |
掲載誌名 | Proc. Asia Pacific Microwave Conference 2017, Nov. 13-16, 2017. (4-pages) (Kuala Lumpur, Malaysia) |
掲載区分 | 国外 |
著者・共著者 | Shun Kikawa, Chun-Ping Chen, Chenglong Xie, Daisuke Tetsuda, Zejun Zhang and Tetsuo Anada, |
概要 | As a non-destructive measurement technique, flanged-open-ended-coaxial-probe-based measurement technique has been attracting a lot of interests in the simultaneous measurement of the complex EM-parameters (i.e. complex permittivity and permeability) of high loss materials. Since at least two complex reflection coefficients under different experimental setting must be obtained to extract two complex parameters simultaneously, in this paper, we proposes a new method, named "Two-Probes-Method". Two reflections are obtained by using two different coaxial probes. The broadband frequency-swept measurements/simulations are then conducted on two absorbing materials using APC-7 and 3.5mm coaxial probes. The experimental results agree with the reference data, which validates the feasibility and effectiveness of this proposed technique. It should be noted that the proposed method is applicable for in-situ/nondestructive measurements. |