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ナカヤマ アキヨシ
Nakayama Akiyoshi 中山 明芳 所属 神奈川大学 工学部 電気電子情報工学科 神奈川大学大学院 工学研究科 工学専攻（電気電子情報工学領域） 職種 教授 |
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| 言語種別 | 英語 |
| 発行・発表の年月 | 2012/06 |
| 形態種別 | 学術雑誌 |
| 査読 | 査読あり |
| 標題 | Magnetic Field Measurement Near a Superconducting Film Using a 2-Dimensional Field-Dependence of Josephson Current Through a Nb Tunnel Junctions Sensor |
| 執筆形態 | 共著 |
| 掲載誌名 | Journal of Nanoscience and Nanotechnology |
| 出版社・発行元 | American Scientific Publishers |
| 巻・号・頁 | 12(6),pp.5016-5020 |
| 著者・共著者 | ◎Akiyoshi Nakayama, Susumu Abe, Norimichi Watanabe, and Yoichi Okabe |
| 概要 | Two-dimensional (2-D) magnetic field dependences of Niobium/niobium tunnel junction current Ic were first used in order to measure the magnetic field near the superconducting film. The 2-D magnetic field dependences of superconducting Josephson current Ic through the niobium/niobium tunnel junction can be changed by the external magnetic field. So, we measured the magnetic field using this superconducting tunnel junction fabricated by DC-magnetron apparatus as a magnetic sensor. The 2-D magnetic field dependences of Ic through the junction without and with the Nb thin-film sample were compared. |
| ISSN | 1533-4880 |
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